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Radiographic inspection of thick metal components, part I: Fitting the standard linear image formation model

  • The Institute of Electrical and Electronics Engineers (IEEE)
  • CREATIS (Centre de Recherche en Acquisition et Traitement de l'Image pour la Santé)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original languageEnglish
Title of host publication2006 IEEE Nuclear Science Symposium - Conference Record
PublisherIEEE (Institute of Electrical and Electronics Engineers)
Pages964-968
Number of pages5
ISBN (Print)1424405610, 9781424405619
DOIs
StatePublished - 2006
Event2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD - San Diego, CA, United States
Duration: Oct 29 2006 → Nov 4 2006

Publication series

NameIEEE Nuclear Science Symposium Conference Record
Volume2
ISSN (Print)1095-7863

Conference

Conference2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD
Country/TerritoryUnited States
CitySan Diego, CA
Period10/29/06 → 11/4/06

ASJC Scopus Subject Areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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